Rider Optimization Algorithm

Version 1.0.0 (2.39 KB) by Binu D

A new optimization algorithm, named, rider optimization algorithm (ROA) is based on a group of riders, , racing toward a target location.

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Updated 24 Mar 2019

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A new optimization algorithm, named, rider optimization algorithm (ROA) is developed. The development of ROA is based on a group of riders, racing toward a target location. Moreover, a classifier, termed RideNN, is developed by including the proposed algorithm as the training algorithm for the neural network (NN).

Cite As

Binu, D., and B. S. Kariyappa. “RideNN: A New Rider Optimization Algorithm-Based Neural Network for Fault Diagnosis in Analog Circuits.” IEEE Transactions on Instrumentation and Measurement, vol. 68, no. 1, Institute of Electrical and Electronics Engineers (IEEE), Jan. 2019, pp. 2–26, doi:10.1109/tim.2018.2836058.

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Created with R2018a

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Version	Published	Release Notes
1.0.0	24 Mar 2019		Download

MLA	Binu, D., and B. S. Kariyappa. “RideNN: A New Rider Optimization Algorithm-Based Neural Network for Fault Diagnosis in Analog Circuits.” IEEE Transactions on Instrumentation and Measurement, vol. 68, no. 1, Institute of Electrical and Electronics Engineers (IEEE), Jan. 2019, pp. 2–26, doi:10.1109/tim.2018.2836058.
APA	Binu, D., & Kariyappa, B. S. (2019). RideNN: A New Rider Optimization Algorithm-Based Neural Network for Fault Diagnosis in Analog Circuits. IEEE Transactions on Instrumentation and Measurement, 68(1), 2–26. Institute of Electrical and Electronics Engineers (IEEE). Retrieved from https://doi.org/10.1109%2Ftim.2018.2836058
BibTeX	@article{Binu_2019, doi = {10.1109/tim.2018.2836058}, url = {https://doi.org/10.1109%2Ftim.2018.2836058}, year = 2019, month = {jan}, publisher = {Institute of Electrical and Electronics Engineers ({IEEE})}, volume = {68}, number = {1}, pages = {2--26}, author = {D. Binu and B. S Kariyappa}, title = {{RideNN}: A New Rider Optimization Algorithm-Based Neural Network for Fault Diagnosis in Analog Circuits}, journal = {{IEEE} Transactions on Instrumentation and Measurement} }